+/* Define some generic bad / good block scan pattern which are used
+ * while scanning a device for factory marked good / bad blocks. */
+static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
+
+static struct nand_bbt_descr smallpage_memorybased = {
+ .options = NAND_BBT_SCAN2NDPAGE,
+ .offs = 5,
+ .len = 1,
+ .pattern = scan_ff_pattern
+};
+