binman: Fix FIT image overlap issues for testFitSplitElf
Fix one binman test that has memory region overlap issue, the test case
needed to be updated to use non-overlapping memory layouts.
* Tests fixed:
- testFitSplitElf
* Changes made:
1. ELF section layouts: added elf_sections_tee.lds with different
address for TEE to avoid overlap with ATF address defined in
elf_sections.lds
2. Makefile to properly build elf_sections_tee binary
3. Updat ftest.py to use separate ELF files for TEE vs ATF components
in split-elf operations.
An upcoming commit will validate if the memory region is overlapped
Signed-off-by: Aristo Chen <aristo.chen@canonical.com>