binman: Fix FIT image overlap issues for testFitSplitElf
authorAristo Chen <jj251510319013@gmail.com>
Sun, 14 Sep 2025 10:59:28 +0000 (10:59 +0000)
committerTom Rini <trini@konsulko.com>
Tue, 23 Sep 2025 19:35:22 +0000 (13:35 -0600)
commita06733fc83f07dd975a9e220a44392f3455c7c21
tree9a4c3316bf1104dda3e1550e7775f526adacea62
parentdade54edaff659c4ed6fc40db0b2dd446714c573
binman: Fix FIT image overlap issues for testFitSplitElf

Fix one binman test that has memory region overlap issue, the test case
needed to be updated to use non-overlapping memory layouts.

* Tests fixed:
  - testFitSplitElf

* Changes made:
  1. ELF section layouts: added elf_sections_tee.lds with different
     address for TEE to avoid overlap with ATF address defined in
     elf_sections.lds
  2. Makefile to properly build elf_sections_tee binary
  3. Updat ftest.py to use separate ELF files for TEE vs ATF components
     in split-elf operations.

An upcoming commit will validate if the memory region is overlapped

Signed-off-by: Aristo Chen <aristo.chen@canonical.com>
tools/binman/ftest.py
tools/binman/test/Makefile
tools/binman/test/elf_sections_tee.c [new symlink]
tools/binman/test/elf_sections_tee.lds [new file with mode: 0644]