From ceff95d49cc3e28c06c2352e8d94f56046271aeb Mon Sep 17 00:00:00 2001
From: Colin Cross <ccross@android.com>
Date: Fri, 13 Dec 2013 14:25:04 -0800
Subject: [PATCH] ion: add test device for unit tests to interact with dma_bufs

Add a /dev/ion-test device that will be created if CONFIG_ION_TEST
is set.  The device accepts a dma_buf fd and allows reading and
writing to the backing memory using DMA-like apis or kernel mapping
apis.  Can be used to test the dma_buf mapping ops, including
the ion implementations, from userspace.

Signed-off-by: Colin Cross <ccross@android.com>
Signed-off-by: John Stultz <john.stultz@linaro.org>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
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