From 65c6b7e3ab70effc150dacc9c2fbd6581925dd53 Mon Sep 17 00:00:00 2001
From: Sebastian Hesselbarth <sebastian.hesselbarth@gmail.com>
Date: Tue, 14 Apr 2015 14:23:30 -0700
Subject: [PATCH] leds: gpio: Fix device teardown on probe deferral

In gpio_leds_create(), when devm_get_gpiod_from_child() fails with
-EPROBE_DEFER on the second gpio led to be created, the first already
registered led is not torn down properly. This causes create_gpio_led()
to fail for the first led on re-probe().

Fix this misbehaviour by incrementing num_leds only if all
potentially failing calls completed successfully.

Signed-off-by: Sebastian Hesselbarth <sebastian.hesselbarth@gmail.com>
Acked-by: Jacek Anaszewski <j.anaszewski@samsung.com>
Signed-off-by: Bryan Wu <cooloney@gmail.com>
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