From 0ee8546ac01864b6e12e65199142e00db59c9809 Mon Sep 17 00:00:00 2001
From: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com>
Date: Tue, 29 Apr 2014 00:51:00 +0100
Subject: [PATCH] IIO: core: Modify scan element type

The current scan element type uses the following format:
  [be|le]:[s|u]bits/storagebits[>>shift].
To specify multiple elements in this type, added a repeat value.
So new format is:
  [be|le]:[s|u]bits/storagebitsXr[>>shift].
Here r is specifying how may times, real/storage bits are repeating.

When X is value is 0 or 1, then repeat value is not used in the format,
and it will be same as existing format.

Signed-off-by: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>
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