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Documentation: usb: ECM subset function testing
authorAndrzej Pietrasiewicz <andrzej.p@samsung.com>
Tue, 16 Dec 2014 13:56:27 +0000 (14:56 +0100)
committerFelipe Balbi <balbi@ti.com>
Mon, 12 Jan 2015 18:13:24 +0000 (12:13 -0600)
Summary of how to test ECM subset function of USB gadget.

Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>

No differences found
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